DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 2022. (DFT 2022)

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066640
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  • Title: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2022)
  • Date/Location: Held 19-21 October 2022, Austin, Texas, USA.
  • Editor: Cassano, Luca et al.
  • IEEE #: CFP22078-POD
  • ISBN: 9781665459396
  • Pages: 171 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2023 )

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  • Title: 2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2022)
  • Date/Location: Held 19-21 October 2022, Austin, Texas, USA.
  • Editor: Cassano, Luca et al.
  • IEEE #: CFP22078-POD
  • ISBN: 9781665459396
  • Pages: 171 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2023 )