Details
- Title: 2021 IEEE 30th Asian Test Symposium (ATS 2021)
- Date/Location: Held 22-24 November 2021, Virtual Conference.
- IEEE #: CFP21067-POD
- ISBN: 9781665440523
- Pages: 144 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2022 )
Description
Members/Attendees
Tab 4
- Title: 2021 IEEE 30th Asian Test Symposium (ATS 2021)
- Date/Location: Held 22-24 November 2021, Virtual Conference.
- IEEE #: CFP21067-POD
- ISBN: 9781665440523
- Pages: 144 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2022 )