DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 2021. (DFT 2021)

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060812
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  • Title: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2021)
  • Date/Location: Held 6-8 October 2021, Virtual Conference.
  • IEEE #: CFP21078-POD
  • ISBN: 9781665416108
  • Pages: 200 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Dec 2021 )

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  • Title: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2021)
  • Date/Location: Held 6-8 October 2021, Virtual Conference.
  • IEEE #: CFP21078-POD
  • ISBN: 9781665416108
  • Pages: 200 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Dec 2021 )