Details
- Title: 2020 IEEE International Test Conference India (ITC India 2020)
- Date/Location: Held 12-14 July 2020, Bangalore, India.
- IEEE #: CFP20N34-POD
- ISBN: 9781728174594
- Pages: 104 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2020 )
Description
Members/Attendees
Tab 4
- Title: 2020 IEEE International Test Conference India (ITC India 2020)
- Date/Location: Held 12-14 July 2020, Bangalore, India.
- IEEE #: CFP20N34-POD
- ISBN: 9781728174594
- Pages: 104 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2020 )