Details
- Title: 2019 IEEE International Test Conference in Asia (ITC-Asia 2019)
- Date/Location: Held 3-5 September 2019, Tokyo, Japan.
- IEEE #: CFP19UWH-POD
- ISBN: 9781728147192
- Pages: 176 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2020 )
Description
Members/Attendees
Tab 4
- Title: 2019 IEEE International Test Conference in Asia (ITC-Asia 2019)
- Date/Location: Held 3-5 September 2019, Tokyo, Japan.
- IEEE #: CFP19UWH-POD
- ISBN: 9781728147192
- Pages: 176 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2020 )