Details
- Title: Physics and Technology of High-k Gate Dielectrics 6
- Subtitle: 214th ECS Meeting
- Date/Location: Held 13-15 October 2008, Honolulu, Hawaii, USA.
- Series: ECS Transactions Volume 16 No.05
- Editor: Kar, S. et al.
- ISBN: 9781607680048
- Pages: 530 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Electrochemical Society (ECS)
- POD Publisher: Curran Associates, Inc. ( May 2017 )
Description
Members/Attendees
Tab 4
- Title: Physics and Technology of High-k Gate Dielectrics 6
- Subtitle: 214th ECS Meeting
- Date/Location: Held 13-15 October 2008, Honolulu, Hawaii, USA.
- Series: ECS Transactions Volume 16 No.05
- Editor: Kar, S. et al.
- ISBN: 9781607680048
- Pages: 530 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Electrochemical Society (ECS)
- POD Publisher: Curran Associates, Inc. ( May 2017 )