THIRD INTERNATIONAL CONFERENCE ON MACHINE VISION, AUTOMATIC IDENTIFICATION, AND DETECTION (MVAID 2024)

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076824

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Title: Third International Conference on Machine Vision, Automatic Identification, and Detection (MVAID 2024)
Date/Location: Held 26-28 April 2024, Kunming, China.
Series: Proceedings of SPIE Volume 13230
Editor: Cen, Fengxin
ISBN: 9781510681880
Pages: 802 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Nov 2024 )

Title: Third International Conference on Machine Vision, Automatic Identification, and Detection (MVAID 2024)
Date/Location: Held 26-28 April 2024, Kunming, China.
Series: Proceedings of SPIE Volume 13230
Editor: Cen, Fengxin
ISBN: 9781510681880
Pages: 802 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Nov 2024 )