THIRD INTERNATIONAL CONFERENCE ON TESTING TECHNOLOGY AND AUTOMATION ENGINEERING (TTAE 2023)

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074264

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Title: Third International Conference on Testing Technology and Automation Engineering (TTAE 2023)
Date/Location: Held 15-17 September 2023, Xi-an, China.
Series: Proceedings of SPIE Volume 13079
Editor: Anwar Ali, Zain
ISBN: 9781510674769
Pages: 338 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( May 2024 )

Title: Third International Conference on Testing Technology and Automation Engineering (TTAE 2023)
Date/Location: Held 15-17 September 2023, Xi-an, China.
Series: Proceedings of SPIE Volume 13079
Editor: Anwar Ali, Zain
ISBN: 9781510674769
Pages: 338 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( May 2024 )