QUANTUM SENSING, IMAGING, AND PRECISION METROLOGY II

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074255

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Details

Title: Quantum Sensing, Imaging, and Precision Metrology II
Subtitle: At SPIE Quantum West
Date/Location: Held 27 January - 1 February 2024, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 12912
Editor: Scheuer, Jacob
ISBN: 9781510670846
Pages: 304 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( May 2024 )

Title: Quantum Sensing, Imaging, and Precision Metrology II
Subtitle: At SPIE Quantum West
Date/Location: Held 27 January - 1 February 2024, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 12912
Editor: Scheuer, Jacob
ISBN: 9781510670846
Pages: 304 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( May 2024 )