OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS X

OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS X

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  • Title: Optical Metrology and Inspection for Industrial Applications X
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 15-16 October 2023, Beijing, China.
  • Series: Proceedings of SPIE Volume 12769
  • Editor: Han, Sen
  • ISBN: 9781510667877
  • Pages: 370 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Apr 2024 )

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  • Title: Optical Metrology and Inspection for Industrial Applications X
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 15-16 October 2023, Beijing, China.
  • Series: Proceedings of SPIE Volume 12769
  • Editor: Han, Sen
  • ISBN: 9781510667877
  • Pages: 370 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Apr 2024 )