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X-RAY NANOIMAGING: INSTRUMENTS AND METHODS VI
- Item #:
- 072021
- UPC:
Details
-
Title:
X-Ray Nanoimaging: Instruments and Methods VI
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 20-24 August 2023, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 12698
-
Editor:
Lai, Barry
-
ISBN:
9781510666108
-
Pages:
86 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jan 2024 )
-
Title:
X-Ray Nanoimaging: Instruments and Methods VI
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 20-24 August 2023, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 12698
-
Editor:
Lai, Barry
-
ISBN:
9781510666108
-
Pages:
86 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jan 2024 )