APPLIED OPTICAL METROLOGY V

APPLIED OPTICAL METROLOGY V

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071995
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Details

  • Title: Applied Optical Metrology V
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 22-23 August 2023, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 12672
  • Editor: Novak, Erik
  • ISBN: 9781510665583
  • Pages: 226 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2024 )

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  • Title: Applied Optical Metrology V
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 22-23 August 2023, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 12672
  • Editor: Novak, Erik
  • ISBN: 9781510665583
  • Pages: 226 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2024 )