AUTOMATED VISUAL INSPECTION AND MACHINE VISION V

AUTOMATED VISUAL INSPECTION AND MACHINE VISION V

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071961
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Details

  • Title: Automated Visual Inspection and Machine Vision V
  • Subtitle: At SPIE Optical Metrology
  • Date/Location: Held 28 June 2023, Munich, Germany.
  • Series: Proceedings of SPIE Volume 12623
  • Editor: Beyerer, Jurgen
  • ISBN: 9781510664555
  • Pages: 160 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2024 )

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  • Title: Automated Visual Inspection and Machine Vision V
  • Subtitle: At SPIE Optical Metrology
  • Date/Location: Held 28 June 2023, Munich, Germany.
  • Series: Proceedings of SPIE Volume 12623
  • Editor: Beyerer, Jurgen
  • ISBN: 9781510664555
  • Pages: 160 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2024 )