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SECOND INTERNATIONAL CONFERENCE ON TESTING TECHNOLOGY AND AUTOMATION ENGINEERING (TTAE 2022)
- Item #:
- 066303
- UPC:
Details
-
Title:
Second International Conference on Testing Technology and Automation Engineering (TTAE 2022)
-
Date/Location:
Held 26-28 August 2022, Changchun, China.
-
Series:
Proceedings of SPIE Volume 12457
-
Editor:
Yue, Yang
-
ISBN:
9781510660199
-
Pages:
480 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jan 2023 )
-
Title:
Second International Conference on Testing Technology and Automation Engineering (TTAE 2022)
-
Date/Location:
Held 26-28 August 2022, Changchun, China.
-
Series:
Proceedings of SPIE Volume 12457
-
Editor:
Yue, Yang
-
ISBN:
9781510660199
-
Pages:
480 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jan 2023 )