SECOND INTERNATIONAL CONFERENCE ON TESTING TECHNOLOGY AND AUTOMATION ENGINEERING (TTAE 2022)

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066303
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Details

  • Title: Second International Conference on Testing Technology and Automation Engineering (TTAE 2022)
  • Date/Location: Held 26-28 August 2022, Changchun, China.
  • Series: Proceedings of SPIE Volume 12457
  • Editor: Yue, Yang
  • ISBN: 9781510660199
  • Pages: 480 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2023 )

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  • Title: Second International Conference on Testing Technology and Automation Engineering (TTAE 2022)
  • Date/Location: Held 26-28 August 2022, Changchun, China.
  • Series: Proceedings of SPIE Volume 12457
  • Editor: Yue, Yang
  • ISBN: 9781510660199
  • Pages: 480 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2023 )