QUANTUM SENSING, IMAGING, AND PRECISION METROLOGY

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068982
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Details

  • Title: Quantum Sensing, Imaging, and Precision Metrology
  • Subtitle: At SPIE Quantum West
  • Date/Location: Held 28 January - 2 February 2023, San Francisco, California, USA.
  • Series: Proceedings of SPIE Volume 12447
  • Editor: Scheuer, Jacob
  • ISBN: 9781510659995
  • Pages: 304 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2023 )

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Tab 4

 
  • Title: Quantum Sensing, Imaging, and Precision Metrology
  • Subtitle: At SPIE Quantum West
  • Date/Location: Held 28 January - 2 February 2023, San Francisco, California, USA.
  • Series: Proceedings of SPIE Volume 12447
  • Editor: Scheuer, Jacob
  • ISBN: 9781510659995
  • Pages: 304 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2023 )