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QUANTUM SENSING, IMAGING, AND PRECISION METROLOGY
- Item #:
- 068982
- UPC:
Details
-
Title:
Quantum Sensing, Imaging, and Precision Metrology
-
Subtitle:
At SPIE Quantum West
-
Date/Location:
Held 28 January - 2 February 2023, San Francisco, California, USA.
-
Series:
Proceedings of SPIE Volume 12447
-
Editor:
Scheuer, Jacob
-
ISBN:
9781510659995
-
Pages:
304 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( May 2023 )
-
Title:
Quantum Sensing, Imaging, and Precision Metrology
-
Subtitle:
At SPIE Quantum West
-
Date/Location:
Held 28 January - 2 February 2023, San Francisco, California, USA.
-
Series:
Proceedings of SPIE Volume 12447
-
Editor:
Scheuer, Jacob
-
ISBN:
9781510659995
-
Pages:
304 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( May 2023 )