OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS IX

OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS IX

Item #:
068873
Our Price: $125.00
Adding to cart… The item has been added

Details

  • Title: Optical Metrology and Inspection for Industrial Applications IX
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 5-11 December 2022, Online Only.
  • Series: Proceedings of SPIE Volume 12319
  • Editor: Han, Sen
  • ISBN: 9781510657045
  • Pages: 490 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2023 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: Optical Metrology and Inspection for Industrial Applications IX
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 5-11 December 2022, Online Only.
  • Series: Proceedings of SPIE Volume 12319
  • Editor: Han, Sen
  • ISBN: 9781510657045
  • Pages: 490 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2023 )