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OPTICS AND PHOTONICS FOR ADVANCED DIMENSIONAL METROLOGY II
- Item #:
- 064289
- UPC:
Details
-
Title:
Optics and Photonics for Advanced Dimensional Metrology II
-
Subtitle:
At SPIE Photonics Europe
-
Date/Location:
Held 5-7 April 2022, Strasbourg, France and 9-20 May 2022, Online.
-
Series:
Proceedings of SPIE Volume 12137
-
Editor:
de Groot, Peter J.
-
ISBN:
9781510651500
-
Pages:
266 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jun 2022 )
-
Title:
Optics and Photonics for Advanced Dimensional Metrology II
-
Subtitle:
At SPIE Photonics Europe
-
Date/Location:
Held 5-7 April 2022, Strasbourg, France and 9-20 May 2022, Online.
-
Series:
Proceedings of SPIE Volume 12137
-
Editor:
de Groot, Peter J.
-
ISBN:
9781510651500
-
Pages:
266 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jun 2022 )