OPTICAL AND QUANTUM SENSING AND PRECISION METROLOGY II

Item #:

063496

Our Price: $110.00

Details

Title: Optical and Quantum Sensing and Precision Metrology II
Subtitle: At SPIE OPTO
Date/Location: Held 22-27 January 2022, San Francisco, California, USA and 20-24 February 2022, Online
Series: Proceedings of SPIE Volume 12016
Editor: Scheuer, Jacob
ISBN: 9781510649033
Pages: 254 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( May 2022 )

Title: Optical and Quantum Sensing and Precision Metrology II
Subtitle: At SPIE OPTO
Date/Location: Held 22-27 January 2022, San Francisco, California, USA and 20-24 February 2022, Online
Series: Proceedings of SPIE Volume 12016
Editor: Scheuer, Jacob
ISBN: 9781510649033
Pages: 254 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( May 2022 )