OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS VIII

OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS VIII

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061459
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  • Title: Optical Metrology and Inspection for Industrial Applications VIII
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 10-19 October 2021, Nantong, Jiangsu, China.
  • Series: Proceedings of SPIE Volume 11899
  • Editor: Han, Sen
  • ISBN: 9781510646476
  • Pages: 230 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Dec 2021 )

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  • Title: Optical Metrology and Inspection for Industrial Applications VIII
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 10-19 October 2021, Nantong, Jiangsu, China.
  • Series: Proceedings of SPIE Volume 11899
  • Editor: Han, Sen
  • ISBN: 9781510646476
  • Pages: 230 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Dec 2021 )