X-RAY NANOIMAGING: INSTRUMENTS AND METHODS V

X-RAY NANOIMAGING: INSTRUMENTS AND METHODS V

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060751
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Details

  • Title: X-Ray Nanoimaging: Instruments and Methods V
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 1-5 August 2021, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 11839
  • Editor: Lai, Barry
  • ISBN: 9781510645165
  • Pages: 66 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Nov 2021 )

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Tab 4

 
  • Title: X-Ray Nanoimaging: Instruments and Methods V
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 1-5 August 2021, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 11839
  • Editor: Lai, Barry
  • ISBN: 9781510645165
  • Pages: 66 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Nov 2021 )