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APPLIED OPTICAL METROLOGY IV
- Item #:
- 060294
- UPC:
Details
-
Title:
Applied Optical Metrology IV
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 1-5 August 2021, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 11817
-
Editor:
Novak, Erik
-
ISBN:
9781510644724
-
Pages:
178 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Oct 2021 )
-
Title:
Applied Optical Metrology IV
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 1-5 August 2021, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 11817
-
Editor:
Novak, Erik
-
ISBN:
9781510644724
-
Pages:
178 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Oct 2021 )