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MODELING ASPECTS IN OPTICAL METROLOGY VIII
- Item #:
- 059605
- UPC:
Details
-
Title:
Modeling Aspects in Optical Metrology VIII
-
Subtitle:
At SPIE Optical Metrology
-
Date/Location:
Held 21-25 June 2021, Online Only.
-
Series:
Proceedings of SPIE Volume 11783
-
Editor:
Bodermann, Bernd
-
ISBN:
9781510644007
-
Pages:
98 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jul 2021 )
-
Title:
Modeling Aspects in Optical Metrology VIII
-
Subtitle:
At SPIE Optical Metrology
-
Date/Location:
Held 21-25 June 2021, Online Only.
-
Series:
Proceedings of SPIE Volume 11783
-
Editor:
Bodermann, Bernd
-
ISBN:
9781510644007
-
Pages:
98 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jul 2021 )