EUV AND X-RAY OPTICS, SOURCES, AND INSTRUMENTATION

EUV AND X-RAY OPTICS, SOURCES, AND INSTRUMENTATION

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059055
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Details

  • Title: EUV and X-ray Optics, Sources, and Instrumentation
  • Subtitle: At SPIE Optics + Optoelectronics
  • Date/Location: Held 19-29 April 2021, Online Only.
  • Series: Proceedings of SPIE Volume 11776
  • Editor: Hudec, Rene
  • ISBN: 9781510643864
  • Pages: 126 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jun 2021 )

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  • Title: EUV and X-ray Optics, Sources, and Instrumentation
  • Subtitle: At SPIE Optics + Optoelectronics
  • Date/Location: Held 19-29 April 2021, Online Only.
  • Series: Proceedings of SPIE Volume 11776
  • Editor: Hudec, Rene
  • ISBN: 9781510643864
  • Pages: 126 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jun 2021 )