OPTICAL TECHNOLOGY AND MEASUREMENT FOR INDUSTRIAL APPLICATIONS 2020

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054926
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  • Title: Optical Technology and Measurement for Industrial Applications 2020
  • Subtitle: At SPIE Technologies and Applications of Structured Light
  • Date/Location: Held 20-24 April 2020, Yokohama, Japan.
  • Series: Proceedings of SPIE Volume 11523
  • Editor: Hatsuzawa, Takeshi
  • ISBN: 9781510638532
  • Pages: 68 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jul 2020 )

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  • Title: Optical Technology and Measurement for Industrial Applications 2020
  • Subtitle: At SPIE Technologies and Applications of Structured Light
  • Date/Location: Held 20-24 April 2020, Yokohama, Japan.
  • Series: Proceedings of SPIE Volume 11523
  • Editor: Hatsuzawa, Takeshi
  • ISBN: 9781510638532
  • Pages: 68 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jul 2020 )