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OPTICAL TECHNOLOGY AND MEASUREMENT FOR INDUSTRIAL APPLICATIONS 2020
- Item #:
- 054926
- UPC:
Details
-
Title:
Optical Technology and Measurement for Industrial Applications 2020
-
Subtitle:
At SPIE Technologies and Applications of Structured Light
-
Date/Location:
Held 20-24 April 2020, Yokohama, Japan.
-
Series:
Proceedings of SPIE Volume 11523
-
Editor:
Hatsuzawa, Takeshi
-
ISBN:
9781510638532
-
Pages:
68 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jul 2020 )
-
Title:
Optical Technology and Measurement for Industrial Applications 2020
-
Subtitle:
At SPIE Technologies and Applications of Structured Light
-
Date/Location:
Held 20-24 April 2020, Yokohama, Japan.
-
Series:
Proceedings of SPIE Volume 11523
-
Editor:
Hatsuzawa, Takeshi
-
ISBN:
9781510638532
-
Pages:
68 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jul 2020 )