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2019 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS
- Item #:
- 053573
- UPC:
Details
-
Title:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
-
Date/Location:
Held 26-28 October 2019, Beijing, China.
-
Series:
Proceedings of SPIE Volume 11439
-
Editor:
Zhu, Jigui
-
ISBN:
9781510636569
-
Pages:
560 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( May 2020 )
-
Title:
2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
-
Date/Location:
Held 26-28 October 2019, Beijing, China.
-
Series:
Proceedings of SPIE Volume 11439
-
Editor:
Zhu, Jigui
-
ISBN:
9781510636569
-
Pages:
560 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( May 2020 )