ADVANCED OPTICAL TECHNIQUES FOR QUANTUM INFORMATION, SENSING, AND METROLOGY

Item #:

054278

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Details

Title: Advanced Optical Techniques for Quantum Information, Sensing, and Metrology
Subtitle: At SPIE OPTO
Date/Location: Held 4-5 February 2020, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 11295
Editor: Hemmer, Philip R.
ISBN: 9781510633537
Pages: 92 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jun 2020 )

Title: Advanced Optical Techniques for Quantum Information, Sensing, and Metrology
Subtitle: At SPIE OPTO
Date/Location: Held 4-5 February 2020, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 11295
Editor: Hemmer, Philip R.
ISBN: 9781510633537
Pages: 92 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jun 2020 )