OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS VI

OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS VI

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052597
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  • Title: Optical Metrology and Inspection for Industrial Applications VI
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 21-23 October 2019, Hangzhou, China.
  • Series: Proceedings of SPIE Volume 11189
  • Editor: Han, Sen
  • ISBN: 9781510630956
  • Pages: 412 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Feb 2020 )

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  • Title: Optical Metrology and Inspection for Industrial Applications VI
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 21-23 October 2019, Hangzhou, China.
  • Series: Proceedings of SPIE Volume 11189
  • Editor: Han, Sen
  • ISBN: 9781510630956
  • Pages: 412 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Feb 2020 )