ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VIII

ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VIII

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050799
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  • Title: Advances in Metrology for X-Ray and EUV Optics VIII
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 11-12 August 2019, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 11109
  • Editor: Assoufid, Lahsen
  • ISBN: 9781510629110
  • Pages: 196 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Oct 2019 )

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  • Title: Advances in Metrology for X-Ray and EUV Optics VIII
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 11-12 August 2019, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 11109
  • Editor: Assoufid, Lahsen
  • ISBN: 9781510629110
  • Pages: 196 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Oct 2019 )