OPTICAL, OPTO-ATOMIC, AND ENTANGLEMENT-ENHANCED PRECISION METROLOGY

OPTICAL, OPTO-ATOMIC, AND ENTANGLEMENT-ENHANCED PRECISION METROLOGY

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048536
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Details

  • Title: Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
  • Subtitle: At SPIE OPTO
  • Date/Location: Held 2-7 February 2019, San Francisco, California, USA.
  • Series: Proceedings of SPIE Volume 10934
  • Editor: Shahriar, Selim M.
  • ISBN: 9781510625105
  • Pages: 334 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2019 )

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  • Title: Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
  • Subtitle: At SPIE OPTO
  • Date/Location: Held 2-7 February 2019, San Francisco, California, USA.
  • Series: Proceedings of SPIE Volume 10934
  • Editor: Shahriar, Selim M.
  • ISBN: 9781510625105
  • Pages: 334 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2019 )