OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS V

OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS V

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047841
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  • Title: Optical Metrology and Inspection for Industrial Applications V
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 11-13 October 2018, Beijing, China.
  • Series: Proceedings of SPIE Volume 10819
  • Editor: Han, Sen
  • ISBN: 9781510622364
  • Pages: 464 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Dec 2018 )

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  • Title: Optical Metrology and Inspection for Industrial Applications V
  • Subtitle: At SPIE/COS Photonics Asia
  • Date/Location: Held 11-13 October 2018, Beijing, China.
  • Series: Proceedings of SPIE Volume 10819
  • Editor: Han, Sen
  • ISBN: 9781510622364
  • Pages: 464 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Dec 2018 )