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OPTICAL SYSTEM ALIGNMENT, TOLERANCING, AND VERIFICATION XII
- Item #:
- 046932
- UPC:
Details
-
Title:
Optical System Alignment, Tolerancing, and Verification XII
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 19-20 August 2018, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 10747
-
Editor:
Sasian, Jose
-
ISBN:
9781510620650
-
Pages:
170 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Nov 2018 )
-
Title:
Optical System Alignment, Tolerancing, and Verification XII
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 19-20 August 2018, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 10747
-
Editor:
Sasian, Jose
-
ISBN:
9781510620650
-
Pages:
170 (1 Vol)
-
Format:
Softcover
-
TOC Link:
View Table of Contents
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Nov 2018 )