2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

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046792

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Details

Title: 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Date/Location: Held 28-30 October 2017, Beijing, China.
Series: Proceedings of SPIE Volume 10621
Editor: Zhu, Jigui
ISBN: 9781510617537
Pages: 686 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jan 2018 )

Title: 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Date/Location: Held 28-30 October 2017, Beijing, China.
Series: Proceedings of SPIE Volume 10621
Editor: Zhu, Jigui
ISBN: 9781510617537
Pages: 686 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jan 2018 )