ADVANCED ETCH TECHNOLOGY FOR NANOPATTERNING VII

ADVANCED ETCH TECHNOLOGY FOR NANOPATTERNING VII

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046761
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Details

  • Title: Advanced Etch Technology for Nanopatterning VII
  • Subtitle: At SPIE Advanced Lithography
  • Date/Location: Held 26-28 February 2018, San Jose, California, USA.
  • Series: Proceedings of SPIE Volume 10589
  • Editor: Engelmann, Sebastian U.
  • ISBN: 9781510616707
  • Pages: 164 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2018 )

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  • Title: Advanced Etch Technology for Nanopatterning VII
  • Subtitle: At SPIE Advanced Lithography
  • Date/Location: Held 26-28 February 2018, San Jose, California, USA.
  • Series: Proceedings of SPIE Volume 10589
  • Editor: Engelmann, Sebastian U.
  • ISBN: 9781510616707
  • Pages: 164 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2018 )