OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X

OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION X

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046512
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  • Title: Optical Measurement Systems for Industrial Inspection X
  • Subtitle: At SPIE Optical Metrology
  • Date/Location: Held 26-29 June 2017, Munich, Germany.
  • Series: Proceedings of SPIE Volume 10329
  • Editor: Lehmann, Peter
  • ISBN: 9781510611030
  • Pages: 1,238 (2 Vols) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jul 2017 )

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  • Title: Optical Measurement Systems for Industrial Inspection X
  • Subtitle: At SPIE Optical Metrology
  • Date/Location: Held 26-29 June 2017, Munich, Germany.
  • Series: Proceedings of SPIE Volume 10329
  • Editor: Lehmann, Peter
  • ISBN: 9781510611030
  • Pages: 1,238 (2 Vols) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jul 2017 )