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METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXX
- Item #:
- 046030
- UPC:
Details
-
Title:
Metrology, Inspection, and Process Control for Microlithography XXX
-
Subtitle:
At SPIE Advanced Lithography
-
Date/Location:
Held 22-25 February 2016, San Jose, California, USA.
-
Series:
Proceedings of SPIE Volume 9778
-
Editor:
Sanchez, Martha I.
-
ISBN:
9781510600133
-
Pages:
1,208 (2 Vols) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jun 2016 )
-
Title:
Metrology, Inspection, and Process Control for Microlithography XXX
-
Subtitle:
At SPIE Advanced Lithography
-
Date/Location:
Held 22-25 February 2016, San Jose, California, USA.
-
Series:
Proceedings of SPIE Volume 9778
-
Editor:
Sanchez, Martha I.
-
ISBN:
9781510600133
-
Pages:
1,208 (2 Vols) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jun 2016 )