8TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: SUBNANOMETER ACCURACY MEASUREMENT FOR SYNCHROTRON OPTICS AND X-RAY OPTICS

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045939

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Title: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
Date/Location: Held 26-29 April 2016, Suzhou, China.
Series: Proceedings of SPIE Volume 9687
Editor: Qian, Shinan
ISBN: 9781628419221
Pages: 126 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Nov 2016 )

Title: 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
Date/Location: Held 26-29 April 2016, Suzhou, China.
Series: Proceedings of SPIE Volume 9687
Editor: Qian, Shinan
ISBN: 9781628419221
Pages: 126 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Nov 2016 )