X-RAY NANOIMAGING: INSTRUMENTS AND METHODS II

X-RAY NANOIMAGING: INSTRUMENTS AND METHODS II

Item #:
045848
Our Price: $80.00
Adding to cart… The item has been added

Details

  • Title: X-Ray Nanoimaging: Instruments and Methods II
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 12-13 August 2015, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 9592
  • Editor: Lai, Barry
  • ISBN: 9781628417586
  • Pages: 136 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Oct 2015 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: X-Ray Nanoimaging: Instruments and Methods II
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 12-13 August 2015, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 9592
  • Editor: Lai, Barry
  • ISBN: 9781628417586
  • Pages: 136 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Oct 2015 )