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OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS III
- Item #:
- 045532
- UPC:
Details
-
Title:
Optical Metrology and Inspection for Industrial Applications III
-
Subtitle:
At SPIE/COS Photonics Asia
-
Date/Location:
Held 9-11 October 2014, Beijing, China.
-
Series:
Proceedings of SPIE Volume 9276
-
Editor:
Han, Sen
-
ISBN:
9781628413496
-
Pages:
490 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Dec 2014 )
-
Title:
Optical Metrology and Inspection for Industrial Applications III
-
Subtitle:
At SPIE/COS Photonics Asia
-
Date/Location:
Held 9-11 October 2014, Beijing, China.
-
Series:
Proceedings of SPIE Volume 9276
-
Editor:
Han, Sen
-
ISBN:
9781628413496
-
Pages:
490 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Dec 2014 )