X-RAY FREE-ELECTRON LASERS: BEAM DIAGNOSTICS, BEAMLINE INSTRUMENTATION, AND APPLICATIONS II

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045466

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Title: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Subtitle: At SPIE Optical Engineering + Applications
Date/Location: Held 18-19 August 2014, San Diego, California, USA.
Series: Proceedings of SPIE Volume 9210
Editor: Hau-Riege, Stefan P.
ISBN: 9781628412376
Pages: 112 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Oct 2014 )

Title: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II
Subtitle: At SPIE Optical Engineering + Applications
Date/Location: Held 18-19 August 2014, San Diego, California, USA.
Series: Proceedings of SPIE Volume 9210
Editor: Hau-Riege, Stefan P.
ISBN: 9781628412376
Pages: 112 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Oct 2014 )