INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VIII

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045429

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Title: Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Subtitle: At SPIE NanoScience + Engineering
Date/Location: Held 20 August 2014, San Diego, California, USA.
Series: Proceedings of SPIE Volume 9173
Editor: Postek, Michael T.
ISBN: 9781628412000
Pages: 98 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Sep 2014 )

Title: Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII
Subtitle: At SPIE NanoScience + Engineering
Date/Location: Held 20 August 2014, San Diego, California, USA.
Series: Proceedings of SPIE Volume 9173
Editor: Postek, Michael T.
ISBN: 9781628412000
Pages: 98 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Sep 2014 )