2013 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

2013 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

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045302
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Details

  • Title: 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
  • Date/Location: Held 17-19 November 2013, Beijing, China.
  • Series: Proceedings of SPIE Volume 9046
  • Editor: Tam, Hwa-Yaw
  • ISBN: 9780819499646
  • Pages: 444 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Dec 2013 )

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  • Title: 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
  • Date/Location: Held 17-19 November 2013, Beijing, China.
  • Series: Proceedings of SPIE Volume 9046
  • Editor: Tam, Hwa-Yaw
  • ISBN: 9780819499646
  • Pages: 444 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Dec 2013 )