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INSTRUMENTATION, METROLOGY, AND STANDARDS FOR NANOMANUFACTURING, OPTICS, AND SEMICONDUCTORS VII
- Item #:
- 045075
- UPC:
Details
-
Title:
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
-
Subtitle:
At SPIE NanoScience + Engineering
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Date/Location:
Held 28-29 August 2013, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 8819
-
Editor:
Postek, Michael T.
-
ISBN:
9780819496690
-
Pages:
112 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Sep 2013 )
-
Title:
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
-
Subtitle:
At SPIE NanoScience + Engineering
-
Date/Location:
Held 28-29 August 2013, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 8819
-
Editor:
Postek, Michael T.
-
ISBN:
9780819496690
-
Pages:
112 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Sep 2013 )