ADVANCES IN X-RAY FREE-ELECTRON LASERS II: INSTRUMENTATION

ADVANCES IN X-RAY FREE-ELECTRON LASERS II: INSTRUMENTATION

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045034
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  • Title: Advances in X-ray Free-Electron Lasers II: Instrumentation
  • Subtitle: At SPIE Optics + Optoelectronics
  • Date/Location: Held 17-19 April 2013, Prague, Czech Republic.
  • Series: Proceedings of SPIE Volume 8778
  • Editor: Tschentscher, Thomas
  • ISBN: 9780819495808
  • Pages: 224 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2013 )

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Tab 4

 
  • Title: Advances in X-ray Free-Electron Lasers II: Instrumentation
  • Subtitle: At SPIE Optics + Optoelectronics
  • Date/Location: Held 17-19 April 2013, Prague, Czech Republic.
  • Series: Proceedings of SPIE Volume 8778
  • Editor: Tschentscher, Thomas
  • ISBN: 9780819495808
  • Pages: 224 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( May 2013 )