DAMAGE TO VUV, EUV, AND X-RAY OPTICS IV; AND EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE III

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045033

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Title: Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Subtitle: At SPIE Optics + Optoelectronics
Date/Location: Held 17-19 April 2013, Prague, Czech Republic.
Series: Proceedings of SPIE Volume 8777
Editor: Hudec, Rene
ISBN: 9780819495792
Pages: 364 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( May 2013 )

Title: Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III
Subtitle: At SPIE Optics + Optoelectronics
Date/Location: Held 17-19 April 2013, Prague, Czech Republic.
Series: Proceedings of SPIE Volume 8777
Editor: Hudec, Rene
ISBN: 9780819495792
Pages: 364 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( May 2013 )