RELIABILITY, PACKAGING, TESTING, AND CHARACTERIZATION OF MOEMS/MEMS AND NANODEVICES XII

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044870

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Title: Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
Subtitle: At SPIE MOEMS-MEMS
Date/Location: Held 4-6 February 2013, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 8614
Editor: Ramesham, Rajeshuni
ISBN: 9780819493835
Pages: 230 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Mar 2013 )

Title: Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS and Nanodevices XII
Subtitle: At SPIE MOEMS-MEMS
Date/Location: Held 4-6 February 2013, San Francisco, California, USA.
Series: Proceedings of SPIE Volume 8614
Editor: Ramesham, Rajeshuni
ISBN: 9780819493835
Pages: 230 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Mar 2013 )