OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II

OPTICAL METROLOGY AND INSPECTION FOR INDUSTRIAL APPLICATIONS II

Item #:
044819
Our Price: $105.00
Adding to cart… The item has been added

Details

  • Title: Optical Metrology and Inspection for Industrial Applications II
  • Subtitle: At Photonics Asia
  • Date/Location: Held 5-8 November 2012, Beijing, China.
  • Series: Proceedings of SPIE Volume 8563
  • Editor: Harding, Kevin G.
  • ISBN: 9780819493187
  • Pages: 328 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2013 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: Optical Metrology and Inspection for Industrial Applications II
  • Subtitle: At Photonics Asia
  • Date/Location: Held 5-8 November 2012, Beijing, China.
  • Series: Proceedings of SPIE Volume 8563
  • Editor: Harding, Kevin G.
  • ISBN: 9780819493187
  • Pages: 328 (1 Vol) (approx)
  • Format: Softcover
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jan 2013 )