X-RAY FREE-ELECTRON LASERS: BEAM DIAGNOSTICS, BEAMLINE INSTRUMENTATION, AND APPLICATIONS

Item #:

044760

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Details

Title: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Subtitle: At SPIE Optical Engineering + Applications
Date/Location: Held 13-16 August 2012, San Diego, California, USA.
Series: Proceedings of SPIE Volume 8504
Editor: Moeller, Stefan P.
ISBN: 9780819492210
Pages: 174 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Oct 2012 )

Title: X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Subtitle: At SPIE Optical Engineering + Applications
Date/Location: Held 13-16 August 2012, San Diego, California, USA.
Series: Proceedings of SPIE Volume 8504
Editor: Moeller, Stefan P.
ISBN: 9780819492210
Pages: 174 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Oct 2012 )