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ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS IV
- Item #:
- 044757
- UPC:
Details
-
Title:
Advances in Metrology for X-Ray and EUV Optics IV
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 12 August 2012, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 8501
-
Editor:
Assoufid, Lahsen
-
ISBN:
9780819492180
-
Pages:
160 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Sep 2012 )
-
Title:
Advances in Metrology for X-Ray and EUV Optics IV
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 12 August 2012, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 8501
-
Editor:
Assoufid, Lahsen
-
ISBN:
9780819492180
-
Pages:
160 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Sep 2012 )