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INTERFEROMETRY XVI: TECHNIQUES AND ANALYSIS
- Item #:
- 044749
- UPC:
Details
-
Title:
Interferometry XVI: Techniques and Analysis
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 13-15 August 2012, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 8493
-
Editor:
Schmit, Joanna
-
ISBN:
9780819492104
-
Pages:
420 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jul 2012 )
-
Title:
Interferometry XVI: Techniques and Analysis
-
Subtitle:
At SPIE Optical Engineering + Applications
-
Date/Location:
Held 13-15 August 2012, San Diego, California, USA.
-
Series:
Proceedings of SPIE Volume 8493
-
Editor:
Schmit, Joanna
-
ISBN:
9780819492104
-
Pages:
420 (1 Vol) (approx)
-
Format:
Softcover
-
Publisher:
SPIE - International Society for Optics and Photonics
-
POD Publisher:
Curran Associates, Inc. ( Jul 2012 )