SCANNING MICROSCOPIES 2012: ADVANCED MICROSCOPY TECHNOLOGIES FOR DEFENSE, HOMELAND SECURITY, FORENSIC, LIFE, ENVIRONMENTAL, AND INDUSTRIAL SCIENCES

Item #:

044634

Our Price: $90.00

Details

Title: Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Subtitle: At SPIE Defense, Security, and Sensing
Date/Location: Held 24-26 April 2012, Baltimore, Maryland, USA.
Series: Proceedings of SPIE Volume 8378
Editor: Postek, Michael T.
ISBN: 9780819490568
Pages: 178 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jun 2012 )

Title: Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Subtitle: At SPIE Defense, Security, and Sensing
Date/Location: Held 24-26 April 2012, Baltimore, Maryland, USA.
Series: Proceedings of SPIE Volume 8378
Editor: Postek, Michael T.
ISBN: 9780819490568
Pages: 178 (1 Vol) (approx)
Format: Softcover
Publisher: SPIE - International Society for Optics and Photonics
POD Publisher: Curran Associates, Inc. ( Jun 2012 )